Physics > Instrumentation and Detectors
[Submitted on 23 Jan 2015 (v1), last revised 24 Nov 2015 (this version, v4)]
Title:Radiation Tolerance of 65nm CMOS Transistors
View PDFAbstract:We report on the effects of ionizing radiation on 65nm CMOS transistors held at approximately -20C during irradiation. The pattern of damage observed after a total dose of 1 Grad is similar to damage reported in room temperature exposures, but we observe less damage than was observed at room temperature.
Submission history
From: David Christian [view email][v1] Fri, 23 Jan 2015 21:39:19 UTC (821 KB)
[v2] Mon, 20 Jul 2015 21:00:17 UTC (844 KB)
[v3] Mon, 28 Sep 2015 14:42:34 UTC (662 KB)
[v4] Tue, 24 Nov 2015 17:20:38 UTC (508 KB)
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